Wafer Prober and Advanced Cantilever Probe Cards
The versatility of our probe stations enables them to be used in a wide range of applications, with a variety of wafer chuck options.
The chuck plate plays an integral part in supporting the wafer throughout processing, not just to accurately position the wafer during testing.
With applications for the semiconductor industry ever diversifying, so are the substrate and materials used to provide new products. Our range of wafer chuck systems have been developed to meet these challenges.
Contact us and talk to one of our experts
Wentworth Laboratories, Inc.
1087 Federal Road
Unit 4
Brookfield
CT 06804
USA
Tel: +1 203-775-0448
Email: info@wentworthlabs.com
Wentworth Laboratories Ltd.
1 Gosforth Close
Sandy
Bedfordshire
SG19 1RB
United Kingdom
Tel: +44 1767 681221
Email: info@wentworthlabs.com
Registered in England, No 1309949
VAT GB 301542902