Wafer Prober and Advanced Cantilever Probe Cards
The S200FA-HV semi-automatic wafer prober addresses today’s power semiconductor test
challenges by delivering accurate low contact resistance measurements even at high currents.
Based on our Pegasus™ FA series semi-automatic wafer probers, it is ideally suited for testing power devices and can be easily integrated with a wide range of tester instruments. The Pegasus™ S200FA-HV platform provides a flexible on-wafer probing solution focused on high-power semiconductor characterization.
Thanks to Kelvin chuck solutions the S200FA-HV achieves low contact resistance measurements in the milliohm range even at high currents.
Wentworth’s Pegasus™ S200FA-HV analytical prober can be configured with either high voltage/high current (HV/HC) probe holders or use dedicated HV/HC current probe card solutions.
Dedicated HV and HC probes reduce probe and device destruction at high voltages/currents by preventing arcing at the tip.
Our high current probe cards (up to 200 A pulsed) handle and distribute high current loads. They use a special surface mount atmospheric chamber to protect against ‘arcing’ or ‘flash over’. Thanks to the use of high temperature probe card materials, testing can be performed over a wide temperature range without the need to change the set up.
The GuardMaster™ enclosure surrounds the chuck and wafer stage, shielding it and the probes from both EMI and light. The microaccess top hat completes the EMI/dark shielding allowing the probes and optics to be inserted into the probing environment while maintaining controlled probing conditions. Features include:
Contact us and talk to one of our experts
Wentworth Laboratories, Inc.
1087 Federal Road
Unit 4
Brookfield
CT 06804
USA
Tel: +1 203-775-0448
Email: info@wentworthlabs.com
Wentworth Laboratories Ltd.
1 Gosforth Close
Sandy
Bedfordshire
SG19 1RB
United Kingdom
Tel: +44 1767 681221
Email: info@wentworthlabs.com
Registered in England, No 1309949
VAT GB 301542902