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Wentworth Laboratories

Wafer Prober and Advanced Cantilever Probe Cards

  • Wafer Probers
    • Analytical Wafer Probers
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Semi-automatic analytical probers – high voltage

PEGASUS™ S200FA-HV​

SEMI-AUTOMATIC ANALYTICAL PROBE STATION FOR HIGH VOLTAGE PROBING

The S200FA-HV semi-automatic wafer prober addresses today’s power semiconductor test
challenges by delivering accurate low contact resistance measurements even at high currents.

Based on our Pegasus™ FA series semi-automatic wafer probers, it is ideally suited for testing power devices and can be easily integrated with a wide range of tester instruments. The Pegasus™ S200FA-HV platform provides a flexible on-wafer probing solution focused on high-power semiconductor characterization. 

analytical high voltage prober

ideal for testing power devices

  • High current probing for DC and pulsed
  • Kelvin sense measurements (source & chuck)
  • Low CRes reverse side contact (drain/source)
  • Suitable for handling thin wafers
  • Low leakage/high voltage
  • Safety for high current/high voltage measurements
Analytical high voltage prober

Pegasus™ S200FA-HV brochure

FIND OUT MORE BY DOWNLOADING THE BROCHURE

DOWNLOAD

high voltage accessories

Thanks to Kelvin chuck solutions the S200FA-HV achieves low contact resistance measurements in the milliohm range even at high currents. 

Wentworth’s Pegasus™ S200FA-HV analytical prober can be configured with either high voltage/high current (HV/HC) probe holders or use dedicated HV/HC current probe card solutions. 

Dedicated HV and HC probes reduce probe and device destruction at high voltages/currents by preventing arcing at the tip.

Our high current probe cards (up to 200 A pulsed) handle and distribute high current loads. They use a special surface mount atmospheric chamber to protect against ‘arcing’ or ‘flash over’. Thanks to the use of high temperature probe card materials, testing can be performed over a wide temperature range without the need to change the set up.

High voltage wafer probing
environmental chambers

Guardmaster and Microaccess

The GuardMaster™ enclosure surrounds the chuck and wafer stage, shielding it and the probes from both EMI and light. The microaccess top hat completes the EMI/dark shielding allowing the probes and optics to be inserted into the probing environment while maintaining controlled probing conditions. Features include:

  • Maintains environmental conditions while probing
  • Provides access for microscope objectives maintaining X,Y & Z manoeuvrability
  • Allows full control/access to probe manipulators
  • Can be used with up to eight manipulators and/or interchangeable probe cards

PROBER ACCESSORIES

Pegasus probe with height and edge sensor

Manipulators & Cables

environmental enclosure

Enclosures & Antivibration Tables

LabMaster

Prober Control Software

Thermal/temperature chuck

Chucks

Probe card holder

Probe Card Holders

Optics and lasers

Optics & Lasers

NEED TO FIND OUT MORE?

Contact us and talk to one of our experts

CONTACT US

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US Head Office

Wentworth Laboratories, Inc.
1087 Federal Road
Unit 4
Brookfield
CT 06804
USA

Tel: +1 203-775-0448
Email: info@wentworthlabs.com

UK Head Office

Wentworth Laboratories Ltd.
1 Gosforth Close
Sandy
Bedfordshire
SG19 1RB
United Kingdom

Tel: +44 1767 681221
Email: info@wentworthlabs.com

Registered in England, No 1309949
VAT GB 301542902

WORLDWIDE LOCAL REPRESENTATIVES

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