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Wentworth Laboratories

Wafer Prober and Advanced Cantilever Probe Cards

  • Wafer Probers
    • Analytical Wafer Probers
      • Semi-Automatic Analytical Probers
      • Semi-Automatic Analytical Probers – HV
      • Manual Analytical Probers – FA Series
      • Manual Analytical Prober – Aspect L1
    • Production Wafer Probers
      • Automatic Production Wafer Probers
      • Semi-Automatic Production Probers
      • Double-Sided Wafer Probers
    • Custom Wafer Probers
    • Prober Accessories
      • Micropositioners and front ends
      • Enclosures and tables
      • LabMaster Prober Control Software
      • Wafer Chucks
      • Optics & Lasers
  • Probe Cards
    • Cantilever Probe Cards
      • Epoxy probe cards
      • Low leakage probe cards
      • High voltage/high current probe cards
      • Extreme temperature probe cards
      • Blade probe cards
      • Probe cards for double-sided probing
      • Custom probe cards
      • Blade probes
    • Probe Card Manufacturing Equipment
  • Applications
    • Controlling our Pegasus™ Probe Stations
    • Double Sided Probing
    • High Impedance Probing
    • High Power Probing
    • MOFSETs and IGBT Probing
    • Wafer Frame Probing
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LabMaster Prober Control Software

LabMaster™ Prober Control Software

LabMaster™ control software for the Pegasus™ series 200 mm and 300 mm wafer probe stations features interactive graphics to centralize real-time monitoring and test setup of the prober and accessories.

Its intuitive graphical user interface enables part-time users to operate the prober with ease, whilst advanced utilities permit the experienced user to design sophisticated test routines. These test routines may then be re-used for automated testing to significantly increase productivity.

LabMaster Pro

Key Features

  • Real-time monitoring and test set-up
  • Controls prober and external devices
  • Intuitive graphical user interface
  • Integrates with leading testers

LabMaster™ FA & Wafer Map Editor

DOWNLOAD THE bROCHURE FOR MORE INFORMATION

DOWNLOAD

ENHANCED FUNCTIONALITY

LabMaster™ offers wafer test setup with the software wizards for creating wafer maps, sub-sites on die, and programming environment for remote control of the prober via Wentworth remote command library. Remote programming allows users to customize their test routines.

Other features include Pattern Recognition (PR) interface for die stepping alignment, thermal control of the thermal chuck temperature and automatic compensation for thermal expansion, and test result monitoring displayed in real time on the wafer map.

LabMaster™ control software is designed for the Pegasus™ Series and seamlessly integrates with leading testers using standard communication protocols, whilst simultaneously communicating with all prober accessories.

LabMaster wafer mapping

NEED TO FIND OUT MORE?

Contact us and talk to one of our experts

CONTACT US

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US Head Office

Wentworth Laboratories, Inc.
1087 Federal Road
Unit 4
Brookfield
CT 06804
USA

Tel: +1 203-775-0448
Email: info@wentworthlabs.com

UK Head Office

Wentworth Laboratories Ltd.
1 Gosforth Close
Sandy
Bedfordshire
SG19 1RB
United Kingdom

Tel: +44 1767 681221
Email: info@wentworthlabs.com

Registered in England, No 1309949
VAT GB 301542902

WORLDWIDE LOCAL REPRESENTATIVES

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