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Wentworth Laboratories

Wafer Prober and Advanced Cantilever Probe Cards

  • Wafer Probers
    • Analytical Wafer Probers
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    • Custom Wafer Probers
    • Prober Accessories & Probes
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Prober Accessories & Probes

Wentworths offers a complete range of prober enhancing accessories and options, complementing and expanding the capabilities of our probe stations.

LabMaster™ allows real-time, fully integrated monitoring and control via a simple-to-use windows based graphical interface. LabMaster™ controls the Pegasus™ prober via either an RS232 interface or a GPIB (IEEE488.2) interface using the National Instruments PCI-GPIB board.

GuardMaster™ provides a combined localized Light-tight and EMC shielded enclosure for low level measurements and frost-free low temperature probing. The compact ergonomic design allows the chuck chamber to be quickly purged with dry air or Nitrogen which provides a very stable environment for sensitive temperature measurements, while still providing easy access for optics, manipulators and probe cards. An extended stage Y axis provides an uninhibited wafer loading position a unique feature of our Semi-Automatic FA series probe stations.

Wentworth offers performance thermal chuck solutions for device testing from -65°C to +400°C. Wentworth’s propriety heating and cooling management system is an integral part of GuardMaster™, utilizing CDA or Nitrogen to reduce thermal effects and keeping the probing environment controlled.

Our prober hardware and software solutions can be customized to your prober/tester requirements and with most configurations, upgrades are available to meet future probing requirements and to insure you have the right return on your investment.

Prober Accessories

Choose from a wide range of prober accessories to enhance probe station performance

Wentworth provides an extensive line of probing platforms and accessories. With global team support and expert capability to design and develop customized solutions for your requirements, we help you minimize and/or eliminate chuck plate influence from test results.

LabMaster™ Prober Control Software

LabMaster™ Prober Control Software

Environmental Chambers GuardMaster™ — EMC and Light Tight Enclosure

Environmental Chambers GuardMaster™ — EMC and Light Tight Enclosure

Dark Box — Shielded Enclosure

Dark Box/EMC shielding

Anti Vibration Tables

Anti Vibration Tables

Pegasus Probe Edge Height Sensor

Pegasus™ Probe Edge / Height Sensor

SAM submicron automated manipulator

SAM — Submicron Automated Manipulator Automated manipulator / positioner for Pegasus™ probers

PVX500 manual linear micropositioner / micromanipulator

PVX500 manual linear micropositioner / micromanipulator

Die Inker for wafers

Die Inker for wafers

Probe Card Holder Adaptable 4.5” or 6” Platen Mounted

Probe Card Holder Adaptable 4.5” or 6” Platen Mounted

Temperature Chucks (hot / cold chucks)

Temperature Chucks (hot / cold chucks)

Microscopes / optics for probers

Microscopes/optics for probers with optional cameras and lasers

Needle Holder Assembly (NHA)

Needle Metallurgy

  • Tungsten
  • Tungsten Rhenium
  • BeCu
  • Paliney®
  • Gold Plating available

Blades: Standard Metal or Ceramic

Most blade shapes are available in several sizes, and all can be combined with a selection of needle probes to provide custom needle holder assemblies

  • Metal mini-blades
  • Metal micro-blades
  • Special IC metal blade
  • Metal hybrid circuit blades
  • Stripline high frequency ceramic blades
Partial selection of blades shown above include (top to bottom): Hybrid Metal, Standard Metal, Mini-Blade, Ceramic.

Partial selection of blades shown above include (top to bottom): Hybrid Metal, Standard Metal, Mini-Blade, Ceramic.

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US Head Office

Wentworth Laboratories, Inc.
1087 Federal Road
Unit 4
Brookfield
CT 06804
USA

Tel: +1 203-775-0448
Email: info@wentworthlabs.com

UK Head Office

Wentworth Laboratories Ltd.
1 Gosforth Close
Sandy
Bedfordshire
SG19 1RB
United Kingdom

Tel: +44 1767 681221
Email: info@wentworthlabs.com

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