Wentworths offers a complete range of prober enhancing accessories and options, complementing and expanding the capabilities of our probe stations.
LabMaster™ allows real-time, fully integrated monitoring and control via a simple-to-use windows based graphical interface. LabMaster™ controls the Pegasus™ prober via either an RS232 interface or a GPIB (IEEE488.2) interface using the National Instruments PCI-GPIB board.
GuardMaster™ provides a combined localized Light-tight and EMC shielded enclosure for low level measurements and frost-free low temperature probing. The compact ergonomic design allows the chuck chamber to be quickly purged with dry air or Nitrogen which provides a very stable environment for sensitive temperature measurements, while still providing easy access for optics, manipulators and probe cards. An extended stage Y axis provides an uninhibited wafer loading position a unique feature of our Semi-Automatic FA series probe stations.
Wentworth offers performance thermal chuck solutions for device testing from -65°C to +400°C. Wentworth’s propriety heating and cooling management system is an integral part of GuardMaster™, utilizing CDA or Nitrogen to reduce thermal effects and keeping the probing environment controlled.
Our prober hardware and software solutions can be customized to your prober/tester requirements and with most configurations, upgrades are available to meet future probing requirements and to insure you have the right return on your investment.
Choose from a wide range of prober accessories to enhance probe station performance
Wentworth provides an extensive line of probing platforms and accessories. With global team support and expert capability to design and develop customized solutions for your requirements, we help you minimize and/or eliminate chuck plate influence from test results.
LabMaster™ Prober Control Software
Environmental Chambers GuardMaster™ — EMC and Light Tight Enclosure
Dark Box/EMC shielding
Anti Vibration Tables
Pegasus™ Probe Edge / Height Sensor
SAM — Submicron Automated Manipulator
PVX500 manual linear micropositioner
Die Inker for wafers
Probe Card Holder Adaptable 4.5” or 6” Platen Mounted
Temperature Chucks (hot / cold chucks)
Prober microscopes/optics with optional cameras & lasers
Needle Holder Assembly (NHA)
- Tungsten Rhenium
- Gold Plating available
Blades: Standard Metal or Ceramic
Most blade shapes are available in several sizes, and all can be combined with a selection of needle probes to provide custom needle holder assemblies
- Metal mini-blades
- Metal micro-blades
- Special IC metal blade
- Metal hybrid circuit blades
- Stripline high frequency ceramic blades