PROBE CARDS FOR DOUBLE-SIDED PROBING
We manufacture probe cards for use with our double-sided wafer probe stations A200D and S200D. Based on epoxy PCBs, they can feature up to 18 probes.
Double-sided wafer probing enables tests to be carried out at wafer stage, which are normally only possible on packaged devices. It provides an accurate and efficient way of fully testing the functionality of sophisticated power devices.
How does it work?
Building probe cards for double-sided probing is a challenging process as it requires the exact alignment of the top and bottom probe card to ensure that simultaneous contact can be made on the same device.
We use a dowel fixing on both top and bottom probe card to ensure accurate lining up of the probe position.
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