Wafer Prober and Advanced Cantilever Probe Cards
We manufacture probe cards for use with our double-sided wafer probe stations A200D and S200D. Based on epoxy PCBs, they can feature up to 18 probes.
Double-sided wafer probing enables tests to be carried out at wafer stage, which are normally only possible on packaged devices. It provides an accurate and efficient way of fully testing the functionality of sophisticated power devices.
Building probe cards for double-sided probing is a challenging process as it requires the exact alignment of the top and bottom probe card to ensure that simultaneous contact can be made on the same device.
We use a dowel fixing on both top and bottom probe card to ensure accurate lining up of the probe position.
Contact us and talk to one of our experts
Wentworth Laboratories, Inc.
1087 Federal Road
Unit 4
Brookfield
CT 06804
USA
Tel: +1 203-775-0448
Email: info@wentworthlabs.com
Wentworth Laboratories Ltd.
1 Gosforth Close
Sandy
Bedfordshire
SG19 1RB
United Kingdom
Tel: +44 1767 681221
Email: info@wentworthlabs.com
Registered in England, No 1309949
VAT GB 301542902