ASPECT L1
Manual analytical probe station for WAFERS UP TO 200 mm
The Aspect L1 manual analytical wafer prober offers a versatile and cost effective solution for general diagnostic probing, engineering test and failure analysis of microcircuits on wafer substrates up to 200 mm (8″).
With its easily maintainable design and range of use, this manual wafer prober offers users the advantage of an economical manual prober with the ability to significantly enhance its performance.
Key Features
- Up to 200 mm (8″) wafer capability
- Rigid construction
- Precision manual XY stage and theta rotation
- Chuck plate vacuum lift
- Manual fine and coarse platform height adjustment
OPTIONS
- Extensive range of probing accessories and cantilever probe cards available
- High and low power optics
- Fast probe mode
- Probe card holder
- Pantograph stage movement available
Design and controls
The Aspect L1 wafer prober is rigidly constructed and its compact platform is easily accessible and upgradeable. Fast probe mode is available in addition to either a high power or low power optics package. It’s designed to accept thermal chucks, and can simultaneously accommodate Wentworth PVX 400 manipulators and a probe card holder for Wentworth cantilever probe cards.
PROBER ACCESSORIES
Manipulators & Cables
Enclosures & Antivibration Tables
Prober Control Software
Chucks
Probe Card Holders
Optics & Lasers
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