Wafer Prober and Advanced Cantilever Probe Cards
The Aspect L1 manual analytical wafer prober offers a versatile and cost effective solution for general diagnostic probing, engineering test and failure analysis of microcircuits on wafer substrates up to 200 mm (8″).
With its easily maintainable design and range of use, this manual wafer prober offers users the advantage of an economical manual prober with the ability to significantly enhance its performance.
The Aspect L1 wafer prober is rigidly constructed and its compact platform is easily accessible and upgradeable. Fast probe mode is available in addition to either a high power or low power optics package. It’s designed to accept thermal chucks, and can simultaneously accommodate Wentworth PVX 400 manipulators and a probe card holder for Wentworth cantilever probe cards.
Contact us and talk to one of our experts
Wentworth Laboratories, Inc.
1087 Federal Road
Unit 4
Brookfield
CT 06804
USA
Tel: +1 203-775-0448
Email: info@wentworthlabs.com
Wentworth Laboratories Ltd.
1 Gosforth Close
Sandy
Bedfordshire
SG19 1RB
United Kingdom
Tel: +44 1767 681221
Email: info@wentworthlabs.com
Registered in England, No 1309949
VAT GB 301542902