Wafer Prober and Advanced Cantilever Probe Cards
Capable of operating in the fA range at voltages up to 30V, Wentworth’s low leakage epoxy probe cards deliver ultra-low leakage measurements. Achieving small pitches down to 50 µm, they are suitable for a range of operating temperatures with superior performance.
We design low leakage probe cards for use with all major parametric analysers including Keithley or Keysight.
Working with a variety of superior engineering materials, we can accommodate most requirements demanded by specialist applications. We can work with all major probe needle materials including Tungsten (W), Tungsten Rhenium (WRe), Beryllium Copper (BeCU) and Palladium alloy (Pd).
We assemble, clean and test our low leakage probe cards to tightly controlled specifications.
Extensive leakage testing, using parametric analysers is carried out to verify the continuity and leakage characteristics of each probe card.
Proven design techniques enable us to achieve fA performance without always having to use a dedicated low leakage board. This means in some cases we can increase the performance of your own existing board designs for low leakage testing.
For applications where our standard range of low leakage options does not suit your requirements, we can design custom PCBs specifically for your low leakage application. Find out more about our custom probe cards
Contact us and talk to one of our experts
Wentworth Laboratories, Inc.
1087 Federal Road
Unit 4
Brookfield
CT 06804
USA
Tel: +1 203-775-0448
Email: info@wentworthlabs.com
Wentworth Laboratories Ltd.
1 Gosforth Close
Sandy
Bedfordshire
SG19 1RB
United Kingdom
Tel: +44 1767 681221
Email: info@wentworthlabs.com
Registered in England, No 1309949
VAT GB 301542902