Wafer Prober and Advanced Cantilever Probe Cards
Visitors are directed to the Voluntary Liquidation announcement in the Company News.
As IC designs become faster, probes become more sophisticated in order to measure today’s very high-speed signals. At the same time, probe loading of measured signals has become more of an issue.
The question of whether to display the signal at the probe tip, or to estimate the signal without the probe and cable, is an important one that designers must take into account.
Download our application note below for more information.
Contact us and talk to one of our experts
Wentworth Laboratories Ltd.
1 Gosforth Close
Sandy
Bedfordshire
SG19 1RB
United Kingdom
Email: info@wentworthlabs.com
Registered in England, No 1309949
VAT GB 301542902
Wentworth Laboratories, Inc.
1087 Federal Road
Unit 4
Brookfield
CT 06804
USA
Email: info@wentworthlabs.com