FAILURE ANALYSIS - HIGH IMPEDANCE PROBING
As IC designs become faster, probes become more sophisticated in order to measure today’s very high-speed signals. At the same time, probe loading of measured signals has become more of an issue.
The question of whether to display the signal at the probe tip, or to estimate the signal without the probe and cable, is an important one that designers must take into account.
Download our application note below for more information.
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