HIGH VOLTAGE AND HIGH CURRENT PROBE CARDS
Testing power semiconductor devices at high voltages and/or high currents carries the risk of damaging devices or test equipment by arcing or overheating. Smaller chip sizes pose even bigger challenges for tests at wafer level.
Wentworth’s high voltage and high current epoxy probe cards offer an ideal solution for minimizing this risk whilst providing reliable probing performance. They can operate at temperatures of up to 250 °C.
high voltage probe cards
Wentworth’s high voltage probe cards are designed to withstand up to 10 kV depending on test set-up. This makes them ideal for testing power devices such as IGBTs and MOSFETs as they also cope with high current.
Featuring a compressed air chamber our high voltage probe cards supress high voltage flashovers (arcing) during test. This avoids damaging the device under test (DUT). Our unique modular solution means that the chamber is removable and can be used on different probe cards to maximise your return on investment.
High Current probe cards
Our high current (HC) probe cards are capable of operating at up to 200 Amp pulsed current. This means they are ideal for carrying out electrical measurements of high-power discrete devices like power transistors, power diodes, thyristors or high-power amplifiers.
The multi-contact design of our HC probe cards distributes the current load evenly across the device surface. As a result, device heating and pad burnout can be avoided effectively.
The addition of a Kelvin sense probe allows accurate measurement of current on the device. This means that the test set up can be adjusted to compensate for any losses.
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