Wafer Prober and Advanced Cantilever Probe Cards
The Mitutoyo FS70 is considered the ideal failure analysis microscope for semiconductor inspection. It uses an enhanced optical technology, designed to yield high magnifications at long working distances.
Designed for streamlined operation and compact integration onto a multitude of probing stations, the A-Zoomµ Micro offers a high-value solution for circuit board, semiconductor and flat-panel display probing without sacrificing features, function or performance.
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Wentworth Laboratories, Inc.
1087 Federal Road
Unit 4
Brookfield
CT 06804
USA
Tel: +1 203-775-0448
Email: info@wentworthlabs.com
Wentworth Laboratories Ltd.
1 Gosforth Close
Sandy
Bedfordshire
SG19 1RB
United Kingdom
Tel: +44 1767 681221
Email: info@wentworthlabs.com
Registered in England, No 1309949
VAT GB 301542902