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Wentworth Laboratories

Wafer Prober and Advanced Cantilever Probe Cards

  • Wafer Probers
    • Analytical Wafer Probers
      • Semi-Automatic Analytical Probers
      • Semi-Automatic Analytical Probers – HV
      • Manual Analytical Probers – FA Series
      • Manual Analytical Prober – Aspect L1
    • Production Wafer Probers
      • Automatic Production Wafer Probers
      • Semi-Automatic Production Probers
      • Double-Sided Wafer Probers
    • Custom Wafer Probers
    • Prober Accessories
      • Micropositioners and front ends
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      • LabMaster Prober Control Software
      • Wafer Chucks
      • Optics & Lasers
  • Probe Cards
    • Cantilever Probe Cards
      • Epoxy probe cards
      • Low leakage probe cards
      • High voltage/high current probe cards
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      • Blade probe cards
      • Probe cards for double-sided probing
      • Custom probe cards
      • Blade probes
    • Probe Card Manufacturing Equipment
  • Applications
    • Controlling our Pegasus™ Probe Stations
    • Double Sided Probing
    • High Impedance Probing
    • High Power Probing
    • MOFSETs and IGBT Probing
    • Wafer Frame Probing
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Failure Analysis Microscopes

MONO MICROSCOPES

FS70 - Ergonomic High-Power failure analysis Microscope

The Mitutoyo FS70 is considered the ideal failure analysis microscope for semiconductor inspection. It uses an enhanced optical technology, designed to yield high magnifications at long working distances.

KEY FEATURES

  • Erect image trinocular (50/50,100/100), erect image tilting trinocular (50/50)
  • Mitutoyo infinity corrected optics
  • Siedentopf design trinocular body tube
  • Widefield (FN=24) 10x eyepieces
  • Three main body types:
    • FS70Z – main body (non-laser) with 1X-2X zoom magnification changer
    • FS70L – main body 1X for three YAG laser wave lengths 1064/532/355 nm
    • FS70L4 – Main body 1X for two wave length ranges 532/266 nm
  • Brightfield objective magnification selections from 1X to 200X
  • Extra-long working distance plan apochromat objectives
  • Laser cutting objectives
  • Long working distance plan objectives for IR, NIR, UV and NUV applications
  • Differential interference contrast (DIC) option for non-laser configurations
  • Reverse 4X nosepiece
  • Optional motorized 4X centerable nosepiece
  • Six-foot cable remote intensity control for fiber optic illuminator
  • Concentric coarse and fine focus – 0.1 mm rev/fine focus
  • Manual focus block or optional motorized focus block
  • Probe station ready with choice of focusing blocks

A-Zoom Micro Analytical Probing Microscope

Designed for streamlined operation and compact integration onto a multitude of probing stations, the A-Zoomµ Micro offers a high-value solution for circuit board, semiconductor and flat-panel display probing without sacrificing features, function or performance.

KEY FEATURES

  • 7:1 parfocal optical zoom
  • 2X quick-slider extends magnification
  • Compact design affords exceptional imaging value and economy for manual probe stations
  • Ergonomic design includes tilting or fixed 10X eyepieces and one-hand magnification adjustment
  • Variety of trinocular and photo port head options offer CCD integration flexibility
  • Easily configured for matching fields-of-view through eyepieces and video (1/2″ camera formats)
  • On-board 10 W LED coaxial (incident) illumination for exceptional brightness & contrast control
  • The heavy-duty focus block offers 50 mm precision travel to establish fine-focus and provide a stable mounting interface for almost any probe station

NEED TO FIND OUT MORE?

Contact us and talk to one of our experts

CONTACT US

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US Head Office

Wentworth Laboratories, Inc.
1087 Federal Road
Unit 4
Brookfield
CT 06804
USA

Tel: +1 203-775-0448
Email: info@wentworthlabs.com

UK Head Office

Wentworth Laboratories Ltd.
1 Gosforth Close
Sandy
Bedfordshire
SG19 1RB
United Kingdom

Tel: +44 1767 681221
Email: info@wentworthlabs.com

Registered in England, No 1309949
VAT GB 301542902

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