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Wentworth Laboratories

Wafer Prober and Advanced Cantilever Probe Cards

  • Wafer Probers
    • Analytical Wafer Probers
      • Semi-Automatic Analytical Probers
      • Semi-Automatic Analytical Probers – HV
      • Manual Analytical Probers – FA Series
      • Manual Analytical Prober – Aspect L1
    • Production Wafer Probers
      • Automatic Production Wafer Probers
      • Semi-Automatic Production Probers
      • Double-Sided Wafer Probers
    • Custom Wafer Probers
    • Prober Accessories
      • Micropositioners and front ends
      • Enclosures and tables
      • LabMaster Prober Control Software
      • Wafer Chucks
      • Optics & Lasers
  • Probe Cards
    • Cantilever Probe Cards
      • Epoxy probe cards
      • Low leakage probe cards
      • High voltage/high current probe cards
      • Extreme temperature probe cards
      • Blade probe cards
      • Probe cards for double-sided probing
      • Custom probe cards
      • Blade probes
    • Probe Card Manufacturing Equipment
  • Applications
    • Controlling our Pegasus™ Probe Stations
    • Double Sided Probing
    • High Impedance Probing
    • High Power Probing
    • MOFSETs and IGBT Probing
    • Wafer Frame Probing
  • Company
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    • Representatives

Epoxy Probe Cards

EPOXY PROBE CARDS

Our epoxy cantilever probe cards complement our range of analytical and production wafer probe stations. In addition, they are also compatible with other manufacturers’ wafer probers.

Epoxy probe cards can accommodate a high pin count, and provide a cost-effective solution for most probing requirements. Our standard epoxy cards are suitable for use with chuck temperatures up to 100°C depending on geometry. For very high or very low temperature probing we offer a range of extreme temperature probe cards. We also offer specialist low leakage and high voltage and high current probe cards. 

Standard probe card

QUICK TURN AROUND TIMES

With our own specialized probe card production facilities in the UK and the US, we are proud of our quick turn-around times for probe card manufacturing. A wide range of options including those listed below means that we can tailor each probe card to your specific requirements:

  • Number of probes
  • Probe and PCB material
  • Pitch
  • Leakage in the nA and pA range

Utilizing only the highest quality of materials means that our probe cards offer excellent long-term reliability and repeatability.

PCB design

Thanks to our comprehensive library of master templates and the use of advanced design software, we can supply PCBs suitable for all major testers platforms and ensure quick turn-around times.

If you prefer, our experienced probe card designers can build probe cards using your own PCB, giving you greater control of the test arrangements. Working in this way, also offers the potential of producing more accurate readings as test components can be positioned closer to the device under test (DUT).

To ensure your final probe card fulfils all the requirements to function correctly, we provide you with full information (including on-track positions, via positions and keep out areas) at the beginning of the project. 

Custom cantilever probe card

Looking for something special?

For more specific requirements please check out our custom probe cards.

NEED TO FIND OUT MORE?

Contact us and talk to one of our experts

CONTACT US

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US Head Office

Wentworth Laboratories, Inc.
1087 Federal Road
Unit 4
Brookfield
CT 06804
USA

Tel: +1 203-775-0448
Email: info@wentworthlabs.com

UK Head Office

Wentworth Laboratories Ltd.
1 Gosforth Close
Sandy
Bedfordshire
SG19 1RB
United Kingdom

Tel: +44 1767 681221
Email: info@wentworthlabs.com

Registered in England, No 1309949
VAT GB 301542902

WORLDWIDE LOCAL REPRESENTATIVES

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