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Wentworth Laboratories

Wafer Prober and Advanced Cantilever Probe Cards

  • Wafer Probers
    • Analytical Wafer Probers
      • Semi-Automatic Analytical Probers
      • Semi-Automatic Analytical Probers – HV
      • Manual Analytical Probers – FA Series
      • Manual Analytical Prober – Aspect L1
    • Production Wafer Probers
      • Automatic Production Wafer Probers
      • Semi-Automatic Production Probers
      • Double-Sided Wafer Probers
    • Custom Wafer Probers
    • Prober Accessories
      • Micropositioners and front ends
      • Enclosures and tables
      • LabMaster Prober Control Software
      • Wafer Chucks
      • Optics & Lasers
  • Probe Cards
    • Cantilever Probe Cards
      • Epoxy probe cards
      • Low leakage probe cards
      • High voltage/high current probe cards
      • Extreme temperature probe cards
      • Blade probe cards
      • Probe cards for double-sided probing
      • Custom probe cards
      • Blade probes
    • Probe Card Manufacturing Equipment
  • Applications
    • Controlling our Pegasus™ Probe Stations
    • Double Sided Probing
    • High Impedance Probing
    • High Power Probing
    • MOFSETs and IGBT Probing
    • Wafer Frame Probing
  • Company
    • About Us
    • News
    • Upcoming Events
    • Employment Opportunities
  • Contact
    • Contact Us
    • Representatives

Environmental Enclosures

ENVIRONMENTAL ENCLOSURES

The environment around your wafer prober can often affect your test results. We offer different enclosures to neutralise the environment – which could be natural or electrical – to ensure test results can be verified. In some cases the environment is required to protect the operator, as well as the test result.

Specifically designed to complement our semi-automatic and manual FA Series probers, both the ShieldMaster™ and GuardMaster™ environmental chambers are also compatible with some of our production wafer prober models. Thanks to their smart design, they enable easy access for optics, manipulators and probe cards. When used with our semi-automatic FA series probe stations, the unique feature of an extended stage Y axis provides an uninhibited wafer loading position.

environmental enclosure

ShieldMaster™

ShieldMaster™ provides a localized enclosure, ideal for frost-free low temperature probing. The compact ergonomic design encloses the stage area of the wafer prober. It therefore allows the chuck chamber to be quickly purged with dry air or nitrogen to remove any residual moisture and prevent condensation build-up and water freezing in the probe environment. This provides a stable environment for accurate probing at below ambient and subzero temperatures.

A safety interlock breaks the electrical connections to prevent the operator to be exposed to high voltage or current. 

environmental chambers

GuardMaster™ EMC shielded enclosure

GuardMaster™ provides a combined EMC shielded and light-tight enclosure for low level measurements and frost-free low temperature probing. Using the same compact design as ShieldMaster™, it features all the same benefits plus the ability to carry out sensitive measurements in an electrically shielded environment. It is therefore ideal for any applications requiring low leakage measurements.

ENVIRONMENTAL ENCLOSURES BROCHURE

DOWNLOAD THE BROCHURE FOR MORE INFORMATION

DOWNLOAD

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US Head Office

Wentworth Laboratories, Inc.
1087 Federal Road
Unit 4
Brookfield
CT 06804
USA

Tel: +1 203-775-0448
Email: info@wentworthlabs.com

UK Head Office

Wentworth Laboratories Ltd.
1 Gosforth Close
Sandy
Bedfordshire
SG19 1RB
United Kingdom

Tel: +44 1767 681221
Email: info@wentworthlabs.com

Registered in England, No 1309949
VAT GB 301542902

WORLDWIDE LOCAL REPRESENTATIVES

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