Wafer Prober and Advanced Cantilever Probe Cards
Our enclosures and tables are designed to help you create protected wafer test environments for sensitive measurements and potentially harmful test situations.
This includes shielding the wafer probe station against RF and light for the purpose of making low current or light sensitive measurements, or eliminating vibration transferred through the laboratory or factory floor.
Our environmental chambers protect the user during extreme temperature or high voltage/high current measurements, whilst eliminating condensation in low temperature scenarios.
Contact us and talk to one of our experts
Wentworth Laboratories, Inc.
1087 Federal Road
Unit 4
Brookfield
CT 06804
USA
Tel: +1 203-775-0448
Email: info@wentworthlabs.com
Wentworth Laboratories Ltd.
1 Gosforth Close
Sandy
Bedfordshire
SG19 1RB
United Kingdom
Tel: +44 1767 681221
Email: info@wentworthlabs.com
Registered in England, No 1309949
VAT GB 301542902