• Skip to main content
  • Skip to footer
  • LinkedIn
  • Twitter
  • YouTube

Wentworth Laboratories

Wafer Prober and Advanced Cantilever Probe Cards

  • Wafer Probers
    • Analytical Wafer Probers
      • Semi-Automatic Analytical Probers
      • Semi-Automatic Analytical Probers – HV
      • Manual Analytical Probers – FA Series
      • Manual Analytical Prober – Aspect L1
    • Production Wafer Probers
      • Automatic Production Wafer Probers
      • Semi-Automatic Production Probers
      • Double-Sided Wafer Probers
    • Custom Wafer Probers
    • Prober Accessories
      • Micropositioners and front ends
      • Enclosures and tables
      • LabMaster Prober Control Software
      • Wafer Chucks
      • Optics & Lasers
  • Probe Cards
    • Cantilever Probe Cards
      • Epoxy probe cards
      • Low leakage probe cards
      • High voltage/high current probe cards
      • Extreme temperature probe cards
      • Blade probe cards
      • Probe cards for double-sided probing
      • Custom probe cards
      • Blade probes
    • Probe Card Manufacturing Equipment
  • Applications
    • Controlling our Pegasus™ Probe Stations
    • Double Sided Probing
    • High Impedance Probing
    • High Power Probing
    • MOFSETs and IGBT Probing
    • Wafer Frame Probing
  • Company
    • About Us
    • News
    • Upcoming Events
    • Employment Opportunities
  • Contact
    • Contact Us
    • Representatives

Applications – Double Sided Probing

POWER SWITCHING DEVICES - DOUBLE SIDED PROBING

As switching time and RDSON of power devices (MOSFETs and IGBTs) has steadily reduced, that progress has been accompanied by a problem related to producing “known good die”.

Many high-performance die today are used in power modules with multiple die per module. The costing of re-working modules to replace die that do not meet specification for switching speed or RDSON is unacceptable in today’s competitive markets where devices require less than 2mΩ.

The problem of accurately measuring the switching time of a power device on a conventional wafer prober, relates to the electrical connection of the tester to the drain or collector via the vacuum chuck plate.

Download our application note below for more information.

Application note

NEED TO FIND OUT MORE?

Contact us and talk to one of our experts

CONTACT US

Footer

US Head Office

Wentworth Laboratories, Inc.
1087 Federal Road
Unit 4
Brookfield
CT 06804
USA

Tel: +1 203-775-0448
Email: info@wentworthlabs.com

UK Head Office

Wentworth Laboratories Ltd.
1 Gosforth Close
Sandy
Bedfordshire
SG19 1RB
United Kingdom

Tel: +44 1767 681221
Email: info@wentworthlabs.com

Registered in England, No 1309949
VAT GB 301542902

WORLDWIDE LOCAL REPRESENTATIVES

© 2023 · Wentworth Labs Wordpress Theme On Genesis Framework · WordPress · Log in

We use cookies on this website to help you find the information you need and receive the best experience possible. By continuing to use our site you are accepting our cookies policy. Ok to continue Reject Read our Privacy and Cookies Policy
Privacy & Cookies Policy

Privacy Overview

This website uses cookies to improve your experience while you navigate through the website. Out of these, the cookies that are categorized as necessary are stored on your browser as they are essential for the working of basic functionalities of the website. We also use third-party cookies that help us analyze and understand how you use this website. These cookies will be stored in your browser only with your consent. You also have the option to opt-out of these cookies. But opting out of some of these cookies may affect your browsing experience.
Necessary
Always Enabled
Necessary cookies are absolutely essential for the website to function properly. This category only includes cookies that ensures basic functionalities and security features of the website. These cookies do not store any personal information.
Non-necessary
Any cookies that may not be particularly necessary for the website to function and is used specifically to collect user personal data via analytics, ads, other embedded contents are termed as non-necessary cookies. It is mandatory to procure user consent prior to running these cookies on your website.
SAVE & ACCEPT
  •