Wafer Prober and Advanced Cantilever Probe Cards
We can provide die inkers suitable for almost any application including high speed off-line inking, post probe inking, inline inking and laser trimming.
Our die inking systems include electric and pneumatic models and utilize convenient, disposable ink cartridges to streamline and optimize the process of marking defective die during the wafer test process.
With ranging dot sizes and the option for non-contact inking, our inkers can be adapted for nearly every test platform and configuration. Inking speeds of up to 12 dots per second enable high speed inking.
Contact us and talk to one of our experts
Wentworth Laboratories, Inc.
1087 Federal Road
Unit 4
Brookfield
CT 06804
USA
Tel: +1 203-775-0448
Email: info@wentworthlabs.com
Wentworth Laboratories Ltd.
1 Gosforth Close
Sandy
Bedfordshire
SG19 1RB
United Kingdom
Tel: +44 1767 681221
Email: info@wentworthlabs.com
Registered in England, No 1309949
VAT GB 301542902