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Wentworth Laboratories

Wafer Prober and Advanced Cantilever Probe Cards

  • Wafer Probers
    • Analytical Wafer Probers
      • Semi-Automatic Analytical Probers
      • Semi-Automatic Analytical Probers – HV
      • Manual Analytical Probers – FA Series
      • Manual Analytical Prober – Aspect L1
    • Production Wafer Probers
      • Automatic Production Wafer Probers
      • Semi-Automatic Production Probers
      • Double-Sided Wafer Probers
    • Custom Wafer Probers
    • Prober Accessories
      • Micropositioners and front ends
      • Enclosures and tables
      • LabMaster Prober Control Software
      • Wafer Chucks
      • Optics & Lasers
  • Probe Cards
    • Cantilever Probe Cards
      • Epoxy probe cards
      • Low leakage probe cards
      • High voltage/high current probe cards
      • Extreme temperature probe cards
      • Blade probe cards
      • Probe cards for double-sided probing
      • Custom probe cards
      • Blade probes
    • Probe Card Manufacturing Equipment
  • Applications
    • Controlling our Pegasus™ Probe Stations
    • Double Sided Probing
    • High Impedance Probing
    • High Power Probing
    • MOFSETs and IGBT Probing
    • Wafer Frame Probing
  • Company
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  • Contact
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    • Representatives

Custom Wafer Probers

CUSTOM WAFER PROBERS

With over 50 years of experience, our ability to create customized and integrated wafer probing solutions is second to none.

Our extensive range of standard wafer probe stations is designed to be configured to your needs using a wide selection of options and accessories to cover most semiconductor test scenarios.

Where this type of customization is not sufficient for your application, we design bespoke wafer probing solutions to meet your specific requirements at an affordable cost.

Custom wafer prober

We have created bespoke solutions for a wide range of applications including

  • MEMS
  • High voltage
  • Photonics
  • Compound semiconductors
  • Flexible and printed electronics
  • Optoelectronics including VCELs devices and MicroLED

Customization Examples

  • Customized wafer handling system, including thin/fragile wafers
  • Bespoke chuck systems, including interchangeable chucks
  • Singulated device testing
  • Reverse side illuminated integrating sphere utilizing glass/quartz chucks

CASE EXAMPLE GALLERY

customer prober with integrating sphere
WATCH VIDEO

Dual-stage prober with 12" integrating sphere

Requirement

To test medical imaging devices at wafer stage to identify faulty devices prior to packaging.

Solution

A dual-stage prober was designed featuring a 12″ integrating sphere, which can be placed close to the underside of the wafer. This enables probing with vertical probe card technology required for this high end production testing. Find out more

Flying arm prober

Requirement

Enable the testing of irregular probing geometries on large area devices or panels

Solution

Two height sensing probes were added to test along the edges of the large area. These probes are able to move independently from the bespoke XY chuck stage to which they are mounted.

Custom wafer prober with flying arms
Custom wafer prober - 360 degree chuck

360° chuck

Requirement

Enable simultaneous probing and sensing of optical devices in a particular orientation without obscuring any part of the device. Opposite sides of each device had to be probed during the process.

Solution

A chuck solution with 360° movement was developed which allows for the two opposite sides of each device to be tested, one after the other. This ensured that the detector above the device, which formed an essential part of the test process, was not obscured during any part of the testing.

Laser system

Requirement

To measure the deflection angle on MEMS devices

Solution

A fully customized optical set-up was provided. This was achieved by sourcing a specialized laser, assembling and configuring the optics and integrating them with the wafer prober. In addition, our designers wrote new software to interface with the laser for full control.

Custom wafer prober with laser

NEED TO FIND OUT MORE?

Contact us and talk to one of our experts

CONTACT US

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US Head Office

Wentworth Laboratories, Inc.
1087 Federal Road
Unit 4
Brookfield
CT 06804
USA

Tel: +1 203-775-0448
Email: info@wentworthlabs.com

UK Head Office

Wentworth Laboratories Ltd.
1 Gosforth Close
Sandy
Bedfordshire
SG19 1RB
United Kingdom

Tel: +44 1767 681221
Email: info@wentworthlabs.com

Registered in England, No 1309949
VAT GB 301542902

WORLDWIDE LOCAL REPRESENTATIVES

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