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Wentworth Laboratories

Wafer Prober and Advanced Cantilever Probe Cards

  • Wafer Probers
    • Analytical Wafer Probers
      • Semi-Automatic Analytical Probers
      • Semi-Automatic Analytical Probers – HV
      • Manual Analytical Probers – FA Series
      • Manual Analytical Prober – Aspect L1
    • Production Wafer Probers
      • Automatic Production Wafer Probers
      • Semi-Automatic Production Probers
      • Double-Sided Wafer Probers
    • Custom Wafer Probers
    • Prober Accessories
      • Micropositioners and front ends
      • Enclosures and tables
      • LabMaster Prober Control Software
      • Wafer Chucks
      • Optics & Lasers
  • Probe Cards
    • Cantilever Probe Cards
      • Epoxy probe cards
      • Low leakage probe cards
      • High voltage/high current probe cards
      • Extreme temperature probe cards
      • Blade probe cards
      • Probe cards for double-sided probing
      • Custom probe cards
      • Blade probes
    • Probe Card Manufacturing Equipment
  • Applications
    • Controlling our Pegasus™ Probe Stations
    • Double Sided Probing
    • High Impedance Probing
    • High Power Probing
    • MOFSETs and IGBT Probing
    • Wafer Frame Probing
  • Company
    • About Us
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  • Contact
    • Contact Us
    • Representatives

Custom Probe Cards

CUSTOM PROBE CARDS

In addition to our ranges of standard epoxy probe cards and those for extreme temperatures, low leakage and high voltage, we design bespoke probe cards to suit your more specific probing requirements.

With established probe card manufacturing facilities in the UK and the US, we can build both epoxy and blade probe cards to suit any wafer probing challenge.

Custom cantilever probe card

wHAT CAN WE CUSTOMIZE?

Customization can include designing any of the following:

  • Probe cards for use on a specific (non-Wentworth) wafer probe station without the use of a standard probe card holder
  • Probe cards for use on non-standard probe card mounts or test heads such as XYZ manipulators
  • Custom PCB layout
  • Probe cards for applications requiring testing at extreme temperature with high voltage/high current

PCB DESIGN

Our comprehensive library of master templates and our ability to create interfaces, ensures that our probe card PCBs can be used with all major tester platforms. At the same time, our advanced in-house design modelling software speeds up the custom design process and enables us to achieve quick turn-around times.

Our experienced probe card designers can design and build complete probe cards for you, however, we also offer the option for you to provide your own PCB if preferred.

pcbs-600x483
custom probe card

uSING YOUR OWN PCB

Using your own PCB when building probe cards enables us to integrate your electronics designs so you maintain full control of the test. Another reason, customers often choose this route is because it can produce more accurate readings as test components can be positioned closer to the device under test (DUT). Reducing the use of longer cables and connections can significantly reduce the noise, and therefore increase the overall accuracy of test results.

Furthermore, it allows for components to be positioned closer to the probe, which allows better circuit optimization.

NEED TO FIND OUT MORE?

Contact us and talk to one of our experts

CONTACT US

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US Head Office

Wentworth Laboratories, Inc.
1087 Federal Road
Unit 4
Brookfield
CT 06804
USA

Tel: +1 203-775-0448
Email: info@wentworthlabs.com

UK Head Office

Wentworth Laboratories Ltd.
1 Gosforth Close
Sandy
Bedfordshire
SG19 1RB
United Kingdom

Tel: +44 1767 681221
Email: info@wentworthlabs.com

Registered in England, No 1309949
VAT GB 301542902

WORLDWIDE LOCAL REPRESENTATIVES

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