Wafer Prober and Advanced Cantilever Probe Cards
In addition to our ranges of standard epoxy probe cards and those for extreme temperatures, low leakage and high voltage, we design bespoke probe cards to suit your more specific probing requirements.
With established probe card manufacturing facilities in the UK and the US, we can build both epoxy and blade probe cards to suit any wafer probing challenge.
Customization can include designing any of the following:
Our comprehensive library of master templates and our ability to create interfaces, ensures that our probe card PCBs can be used with all major tester platforms. At the same time, our advanced in-house design modelling software speeds up the custom design process and enables us to achieve quick turn-around times.
Our experienced probe card designers can design and build complete probe cards for you, however, we also offer the option for you to provide your own PCB if preferred.
Using your own PCB when building probe cards enables us to integrate your electronics designs so you maintain full control of the test. Another reason, customers often choose this route is because it can produce more accurate readings as test components can be positioned closer to the device under test (DUT). Reducing the use of longer cables and connections can significantly reduce the noise, and therefore increase the overall accuracy of test results.
Furthermore, it allows for components to be positioned closer to the probe, which allows better circuit optimization.
Contact us and talk to one of our experts
Wentworth Laboratories, Inc.
1087 Federal Road
Unit 4
Brookfield
CT 06804
USA
Tel: +1 203-775-0448
Email: info@wentworthlabs.com
Wentworth Laboratories Ltd.
1 Gosforth Close
Sandy
Bedfordshire
SG19 1RB
United Kingdom
Tel: +44 1767 681221
Email: info@wentworthlabs.com
Registered in England, No 1309949
VAT GB 301542902