During these challenging times Wentworth continues to support the semiconductor industry and provide solutions to help test a wide range of devices, but it has required a top-down review of the way we conduct our business. From regular deep cleaning to our service & applications support, it has been necessary to make changes to keep […]
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PROBE CARDS – FROM DESIGN TO DELIVERY
How to build a quality probe card Cantilever probe cards are used to probe microchips before dicing to determine whether the individual circuits meet their design specifications. Probe cards must enable reliable, repeatable, and consistent electrical contacts between the test system and the chip pads. Ensuring these probe cards are built with quality, accuracy and […]
... Read MoreThe diversity of wafer chucks
The humble chuck plate plays an integral part in supporting the wafer throughout the front-end processing, not just to accurately position the wafer during testing. With applications for the semiconductor industry ever diversifying, so are the substrate and materials used to provide new products so the chuck plates are constantly adapting. Design Wafer chucks are […]
... Read MoreCONSIDERATIONS FOR BLADE PROBES
Blade probe cards can offer a cost-effective solution for less complex wafer test applications. Thanks to their inherent design, blade probe cards offer good visual and physical access to the device under test (DUT). This makes them ideal for tests which require the use of optics to view the device during probing or where a […]
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