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Wentworth Laboratories

Wafer Prober and Advanced Cantilever Probe Cards

  • Wafer Probers
    • Analytical Wafer Probers
      • Semi-Automatic Analytical Probers
      • Semi-Automatic Analytical Probers – HV
      • Manual Analytical Probers – FA Series
      • Manual Analytical Prober – Aspect L1
    • Production Wafer Probers
      • Automatic Production Wafer Probers
      • Semi-Automatic Production Probers
      • Double-Sided Wafer Probers
    • Custom Wafer Probers
    • Prober Accessories
      • Micropositioners and front ends
      • Enclosures and tables
      • LabMaster Prober Control Software
      • Wafer Chucks
      • Optics & Lasers
  • Probe Cards
    • Cantilever Probe Cards
      • Epoxy probe cards
      • Low leakage probe cards
      • High voltage/high current probe cards
      • Extreme temperature probe cards
      • Blade probe cards
      • Probe cards for double-sided probing
      • Custom probe cards
      • Blade probes
    • Probe Card Manufacturing Equipment
  • Applications
    • Controlling our Pegasus™ Probe Stations
    • Double Sided Probing
    • High Impedance Probing
    • High Power Probing
    • MOFSETs and IGBT Probing
    • Wafer Frame Probing
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Blog

The “New Normal”

13th May 2020

During these challenging times Wentworth continues to support the semiconductor industry and provide solutions to help test a wide range of devices, but it has required a top-down review of the way we conduct our business. From regular deep cleaning to our service & applications support, it has been necessary to make changes to keep […]

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PROBE CARDS – FROM DESIGN TO DELIVERY

27th February 2020

Probe card design - table 1

How to build a quality probe card Cantilever probe cards are used to probe microchips before dicing to determine whether the individual circuits meet their design specifications. Probe cards must enable reliable, repeatable, and consistent electrical contacts between the test system and the chip pads. Ensuring these probe cards are built with quality, accuracy and […]

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The diversity of wafer chucks

4th February 2020

Microhole chuck

The humble chuck plate plays an integral part in supporting the wafer throughout the front-end processing, not just to accurately position the wafer during testing. With applications for the semiconductor industry ever diversifying, so are the substrate and materials used to provide new products so the chuck plates are constantly adapting. Design Wafer chucks are […]

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CONSIDERATIONS FOR BLADE PROBES

5th November 2019

2-wire edge sensors

Blade probe cards can offer a cost-effective solution for less complex wafer test applications. Thanks to their inherent design, blade probe cards offer good visual and physical access to the device under test (DUT). This makes them ideal for tests which require the use of optics to view the device during probing or where a […]

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Wentworth Laboratories, Inc.
1087 Federal Road
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Brookfield
CT 06804
USA

Tel: +1 203-775-0448
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Wentworth Laboratories Ltd.
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Sandy
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