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Wentworth Laboratories

Wafer Prober and Advanced Cantilever Probe Cards

  • Wafer Probers
    • Analytical Wafer Probers
      • Semi-Automatic Analytical Probers
      • Semi-Automatic Analytical Probers – HV
      • Manual Analytical Probers – FA Series
      • Manual Analytical Prober – Aspect L1
    • Production Wafer Probers
      • Automatic Production Wafer Probers
      • Semi-Automatic Production Probers
      • Double-Sided Wafer Probers
    • Custom Wafer Probers
    • Prober Accessories
      • Micropositioners and front ends
      • Enclosures and tables
      • LabMaster Prober Control Software
      • Wafer Chucks
      • Optics & Lasers
  • Probe Cards
    • Cantilever Probe Cards
      • Epoxy probe cards
      • Low leakage probe cards
      • High voltage/high current probe cards
      • Extreme temperature probe cards
      • Blade probe cards
      • Probe cards for double-sided probing
      • Custom probe cards
      • Blade probes
    • Probe Card Manufacturing Equipment
  • Applications
    • Controlling our Pegasus™ Probe Stations
    • Double Sided Probing
    • High Impedance Probing
    • High Power Probing
    • MOFSETs and IGBT Probing
    • Wafer Frame Probing
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Cantilever Probe Cards

CANTILEVER PROBE CARDS

With specialist probe card facilities based in Europe and North America, we build a wide range of standard and custom cantilever probe cards based on epoxy and blade technologies.

Our epoxy probe cards can accommodate high pin counts and benefit from competitive pricing and quick turn-around times. We also have the expertise to build blade probe cards and offer a wide range of parts for their repair. All our probe cards are supported by a fast maintenance and repair service. 

key features

  • Covering temperature ranges from -271°C (2 Kelvin) to +300°C
  • For high voltage up to 10kV and high current up to 200 Amps and beyond
  • Low leakage down to femtoamp (fA) range
  • Needle materials include Tungsten (W), Tungsten Rhenium (WRe), Beryllium Copper (BeCU) and Palladium alloy (Pd)

low cost of ownership

  • Excellent longevity
  • Low tip wear
  • High precision alignment
  • Excellent planarity
  • Stable Contact Resistance (Cres)
Standard probe card

Epoxy

Low leakage probe card

Low leakage

High voltage probe card

High voltage/current

Cryogenic probe card

Extreme temperature

blade probe cards

Blade

Double-sided probing

Custom probe card

Custom

Blades probes (NHAs)

Probe card manufacturing equipment

Manufacturing equipment

probe card brochure

For more information please download our brochure

DOWNLOAD

APPLICATIONS

Wentworth’s dedicated probe card teams are highly experienced in designing and building cantilever probe cards for many applications including high current, high voltage, low leakage, high temperature, cryogenic, radio frequency, multiple die and bar testing.

We have experience of building probe cards used to test displays, LEDs, MEMS, flip chip, ceramic substrates, power semiconductors including MOSFETs and IGBTs as well as optical, memory, logic and many other devices. As an ISO 9001 certified company, our professionals work closely with you to support your project from concept right through to completion.

Probe card design

Central to our probe card design processes is our in-house developed cantilever probe card design software. It ensures all quality requirements including ISO9001 are met consistently by

  • Supporting the automated design of key components
  • Importing device specific data automatically to create all manufacturing documentation
  • Facilitating the automatic programming of key manufacturing equipment and tracking progress through the manufacturing process
  • Controlling state-of-the-art micro machining tools
Probe card manufacturing equipment

Your own designs

Thanks to our own custom-built software and the use of other industry standard software applications such as AutoCAD, Cadence and SolidWorks, we can accept your designs in a wide range of file types including .stl, .sld, .stp, .igs, .dwg, .dxf and .grb.

If you are looking to build or maintain your own probe cards, we also offer probe card manufacturing equipment, printed circuit boards and an extensive range of metal and ceramic needle holder assemblies.

NEED TO FIND OUT MORE?

Contact us and talk to one of our experts

CONTACT US

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US Head Office

Wentworth Laboratories, Inc.
1087 Federal Road
Unit 4
Brookfield
CT 06804
USA

Tel: +1 203-775-0448
Email: info@wentworthlabs.com

UK Head Office

Wentworth Laboratories Ltd.
1 Gosforth Close
Sandy
Bedfordshire
SG19 1RB
United Kingdom

Tel: +44 1767 681221
Email: info@wentworthlabs.com

Registered in England, No 1309949
VAT GB 301542902

WORLDWIDE LOCAL REPRESENTATIVES

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