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Wentworth Laboratories

Wafer Prober and Advanced Cantilever Probe Cards

  • Wafer Probers
    • Analytical Wafer Probers
      • Semi-Automatic Analytical Probers
      • Semi-Automatic Analytical Probers – HV
      • Manual Analytical Probers – FA Series
      • Manual Analytical Prober – Aspect L1
    • Production Wafer Probers
      • Automatic Production Wafer Probers
      • Semi-Automatic Production Probers
      • Double-Sided Wafer Probers
    • Custom Wafer Probers
    • Prober Accessories
      • Micropositioners and front ends
      • Enclosures and tables
      • LabMaster Prober Control Software
      • Wafer Chucks
      • Optics & Lasers
  • Probe Cards
    • Cantilever Probe Cards
      • Epoxy probe cards
      • Low leakage probe cards
      • High voltage/high current probe cards
      • Extreme temperature probe cards
      • Blade probe cards
      • Probe cards for double-sided probing
      • Custom probe cards
      • Blade probes
    • Probe Card Manufacturing Equipment
  • Applications
    • Controlling our Pegasus™ Probe Stations
    • Double Sided Probing
    • High Impedance Probing
    • High Power Probing
    • MOFSETs and IGBT Probing
    • Wafer Frame Probing
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  • Contact
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    • Representatives

Blade Probe Cards

BLADE PROBE CARDS

Blade probe cards can offer a cost-effective solution for less complex wafer test applications.

We have the expertise to build brand-new blade cards and re-build or repair existing ones. Using high-end materials and pre-assembled parts, we provide quick and low-priced solutions to complement our own wafer probe stations. They can also be used with other test equipment. 

blade probe cards

BENEFITS

For applications where device sizes are above 100 microns and desired pin counts are low, blade probe cards can easily deliver the required accuracy at a much lower cost than epoxy probe cards.

Our cards boast competitive prices and quick turn-around times, thanks to their simpler manufacturing process. We build on a 4.5” base with a choice of 48-way and 70-way edge-connect PCBs.

Due to their inherent design, blade cards offer good visual and physical access to the device under test (DUT). This makes them ideal for tests which require the use of optics to view the device during probing or where a diagnostic probe is needed in addition to the probe card.

BUILDING YOUR OWN PROBE CARDS

Blade probe cards are generally easier to build than epoxy probe cards and therefore ideally suited for organizations wishing to build or repair their own probe cards in-house. 

If you are looking to build your own probe cards, we offer probe card manufacturing equipment to assist with the building, maintenance and repair. In addition, we provide a wide range of parts for probe card repair including probes and blade probes.

Probe card manufacturing equipment

NEED TO FIND OUT MORE?

Contact us and talk to one of our experts

CONTACT US

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US Head Office

Wentworth Laboratories, Inc.
1087 Federal Road
Unit 4
Brookfield
CT 06804
USA

Tel: +1 203-775-0448
Email: info@wentworthlabs.com

UK Head Office

Wentworth Laboratories Ltd.
1 Gosforth Close
Sandy
Bedfordshire
SG19 1RB
United Kingdom

Tel: +44 1767 681221
Email: info@wentworthlabs.com

Registered in England, No 1309949
VAT GB 301542902

WORLDWIDE LOCAL REPRESENTATIVES

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