Wafer Prober and Advanced Cantilever Probe Cards
Blade probe cards can offer a cost-effective solution for less complex wafer test applications.
We have the expertise to build brand-new blade cards and re-build or repair existing ones. Using high-end materials and pre-assembled parts, we provide quick and low-priced solutions to complement our own wafer probe stations. They can also be used with other test equipment.
For applications where device sizes are above 100 microns and desired pin counts are low, blade probe cards can easily deliver the required accuracy at a much lower cost than epoxy probe cards.
Our cards boast competitive prices and quick turn-around times, thanks to their simpler manufacturing process. We build on a 4.5” base with a choice of 48-way and 70-way edge-connect PCBs.
Due to their inherent design, blade cards offer good visual and physical access to the device under test (DUT). This makes them ideal for tests which require the use of optics to view the device during probing or where a diagnostic probe is needed in addition to the probe card.
Blade probe cards are generally easier to build than epoxy probe cards and therefore ideally suited for organizations wishing to build or repair their own probe cards in-house.
If you are looking to build your own probe cards, we offer probe card manufacturing equipment to assist with the building, maintenance and repair. In addition, we provide a wide range of parts for probe card repair including probes and blade probes.
Contact us and talk to one of our experts
Wentworth Laboratories, Inc.
1087 Federal Road
Unit 4
Brookfield
CT 06804
USA
Tel: +1 203-775-0448
Email: info@wentworthlabs.com
Wentworth Laboratories Ltd.
1 Gosforth Close
Sandy
Bedfordshire
SG19 1RB
United Kingdom
Tel: +44 1767 681221
Email: info@wentworthlabs.com
Registered in England, No 1309949
VAT GB 301542902