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Wentworth Laboratories

Wafer Prober and Advanced Cantilever Probe Cards

  • Wafer Probers
    • Analytical Wafer Probers
      • Semi-Automatic Analytical Probers
      • Semi-Automatic Analytical Probers – HV
      • Manual Analytical Probers – FA Series
      • Manual Analytical Prober – Aspect L1
    • Production Wafer Probers
      • Automatic Production Wafer Probers
      • Semi-Automatic Production Probers
      • Double-Sided Wafer Probers
    • Custom Wafer Probers
    • Prober Accessories
      • Micropositioners and front ends
      • Enclosures and tables
      • LabMaster Prober Control Software
      • Wafer Chucks
      • Optics & Lasers
  • Probe Cards
    • Cantilever Probe Cards
      • Epoxy probe cards
      • Low leakage probe cards
      • High voltage/high current probe cards
      • Extreme temperature probe cards
      • Blade probe cards
      • Probe cards for double-sided probing
      • Custom probe cards
      • Blade probes
    • Probe Card Manufacturing Equipment
  • Applications
    • Controlling our Pegasus™ Probe Stations
    • Double Sided Probing
    • High Impedance Probing
    • High Power Probing
    • MOFSETs and IGBT Probing
    • Wafer Frame Probing
  • Company
    • About Us
    • News
    • Upcoming Events
    • Employment Opportunities
  • Contact
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    • Representatives

Performance wafer probe stations and advanced cantilever probe cards

Wentworth Laboratories are a world-wide leader in performance wafer probe stations and advanced cantilever probe cards. Our wafer prober products have been selected for many leading-edge semiconductor wafer applications across the globe. In partnership with our customers, we develop cost-effective and productivity-enhancing wafer probing solutions.

Through a global network of experienced representatives we support your projects with sophisticated design, proven technology, as well as applications and technical support. Our reputation for creating bespoke wafer probing solutions is second to none.

ANALYTICAL WAFER PROBERS

ANALYTICAL WAFER PROBERS

Our range of analytical wafer probe stations is specifically designed for failure analysis, device characterization and other analytical testing.

We offer a choice of semi-automatic and manual probers for testing wafer sizes up to 200mm and 300mm.

PRODUCTION WAFER PROBERS

Production wafer probers

Our range of production wafer probe stations offers rapid probing with a choice of semi-automatic, fully automatic and double-sided wafer probing platforms.

They are ideally suited for characterization of wafer sizes from 2” to 12″ (up to 300mm), for full or partial wafers.

CANTILEVER PROBE CARDS

CANTILEVER PROBE CARDS

Wentworth cantilever probe card products include blade and epoxy probe cards. Applications range from multiple die to memory, radio frequency, logic and high voltage. 

We also offer an extensive range of metal and ceramic needle holder assemblies.

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US Head Office

Wentworth Laboratories, Inc.
1087 Federal Road
Unit 4
Brookfield
CT 06804
USA

Tel: +1 203-775-0448
Email: info@wentworthlabs.com

UK Head Office

Wentworth Laboratories Ltd.
1 Gosforth Close
Sandy
Bedfordshire
SG19 1RB
United Kingdom

Tel: +44 1767 681221
Email: info@wentworthlabs.com

Registered in England, No 1309949
VAT GB 301542902

WORLDWIDE LOCAL REPRESENTATIVES

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