Wentworth Laboratories Advanced Vertical Probe Cards

Wentworth has developed a proprietary vertical probe card design that is tunable for many exacting memory and logic applications while also offering the unique advantage of on-site maintainability by the user. These advanced vertical probe cards feature patented Saber â Probe vertical contact technology, a photo-defined and chemically etched contact that offers superb current carrying capability, superior life performance and the scalability to simultaneously address the industry's most demanding pitch requirements.

Wentworth provides turnkey solutions from concept to completed probe card, with custom designed interfaces to facilitate communications between the device, probe card and tester.

Wentworth is the exclusive representative for Korea-based Advanced Micro Silicon Technology (AMST) in the United States, and offers MEMs-based technology for 300mm one-touchdown NAND probing, and fine pitch, high parallel multiple die testing of DRAMS and NOR flash.