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vertical probe card solutions for memory and logic · cantilever probe cards · complete custom probe card design · full complement of probers for applications to 300mm

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In addition to exceptional probe card solutions, Wentworth Laboratories offers an expansive line of manual, semi-automatic and automatic wafer probing platforms and accessories for applications to 300mm.

Wentworth's flagship platform is the Pegasus™ Series semi-automatic and automatic probers. Pegasus Series probers utilize productivity-enhancing accessories such as an intuitive graphic user interface, submicron automated manipulators, hot chucks, optics, laser, environmental chambers and more. Wentworth probers are fully networked and are compatible with all major testers.

Pegasus Instrument Inc., a joint venture of Wentworth Laboratories and Quatek Group, manufactures Pegasus probers in Taiwan and provides field service and applications for China and Taiwan. Wentworth is also an expert resource for the service and maintenance of Electroglas probers.

Wentworth Probers

PCBS AND INTERFACES

Prober Recommendations - Production Probing

FAST Links

Laser diodes, SAW Filter,
MEMS, LED, Discrete Devices

Pegasus S200, 200mm
Semi-Automatic Prober

Pegasus S200D, 200mm
Semi-Automatic
Double-SidedProber

Discretes, MOSFETs, IGBT Devices, Test Correlation

Pegasus 300S, 300mm
Semi-Automatic Prober

Traditional Testing, Device Characterization, Failure Analysis

More Analytical Probers

APS 80, 200mm
Automatic Prober

High Volume, Special Handling GaAs, Saw Frames, Ceramics, Silicon

Semi-Automatic Probers

Sales Offices

Device Characterization

Support for Electroglas Probers

APS80D, 200mm
Double-Sided Automatic Prober
High Volume Probing of Power Devices

Process characterization

Design Verification

Failure Analysis

Cantilever Build/Repair Stations

Automatic Probers

Pegasus™ S200 semi-automatic prober delivers rapid production probing of wafers up to 200mm, for semiconductors, MEMs, and characterization applications, and is ideal for probing LED die mounted onto blue tape/ring carriers

Pegasus™ S200D semi-automatic prober is an ideal solution for applications requiring double-sided probing of wafers up to 200mm, such as discretes, MOSFETs and IGBT devices. It is also highly recommended for test correlation or engineering design teams working on these device types to minimize and/or eliminate chuck plate influence from test results

Pegasus™ 300S semi-automatic prober is available for probing wafers (up to 200mm) that have been diced on a saw frame

APS80 automatic prober for 2" to 8" (50mm to 200mm) wafers, is for high volume, special handling applications such as saw frame, gallium arsenide (GaAs), thin wafers, and ceramics. APS80 accommodates a variety of special production test requirements/applications including partial wafer mapping and electrostatic discharge (ESD).

APS 80D automatic double-sided prober configuration is also available - recommended for high volume probing of power devices on 150mm (6") wafers

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