Semi-Automatic
APS80 automatic prober for 2" to 8" (50mm to 200mm) wafers, is for high volume, special handling applications such as saw frame, gallium arsenide (GaAs), thin wafers, and ceramics.
APS80 accommodates a variety of special production test requirements/applications including partial wafer mapping and electrostatic discharge (ESD).
APS 80D automatic double-sided prober configuration is also available - recommended for high volume probing of power devices on 150mm (6") wafers.
Automatic
Pegasus S200 semi-automatic prober delivers rapid production probing of wafers up to 200mm, for semiconductors, MEMs, and characterization applications, and is ideal for probing LED die mounted onto blue tape/ring carriers.
Pegasus S200D semi-automatic prober is an ideal solution for applications requiring double-sided probing of wafers up to 200mm, such as discretes, MOSFETs and IGBT devices. It is also highly recommended for test correlation or engineering design teams working on these device types to minimize and/or eliminate chuck plate influence from test results.
Pegasus 300S semi-automatic prober is available for probing wafers (up to 200mm) that have been diced on a saw frame.
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2009
Wentworth Laboratories, Inc.
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Headquarters: Wentworth Laboratories, Inc., 500 Federal Road, Brookfield, CT 06804 USA Tel: 203-775-9311, Fax: 203-775-6093