MP 1008 Manual Prober
 The MP 1008, manual prober for 8-inch wafers, is a versatile and economical solution for general diagnostic probing, engineering test and failure analysis of microcircuits. Featuring precision XY stage motion and micrometer control of the probing platform, the MP 1008 may be used with both 4.5-inch and 6-inch wide probe cards, in some instances simultaneously if required. Sophisticated PVX 400 series probe head assemblies for the MP 1008 enable three dimensional recirculating linear bearing adjustment for probing 3-micron to 5-micron geometries. |
The MP 1008 analytical prober features an 8-inch diameter, electroless nickel-plated vacuum chuck that is designed to accept hot and cold temperature controlled chucks. Unique to the MP 1008 is an XY-adjustable microscope mount that permits travel toward the operator in excess of 3.5 inches and side-to-side sweep, enabling the scanning of a 4-inch x 4-inch wide hybrid substrate without moving the substrate. Features
All specifications are subject to
change without notice. |
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