COBRA®
Vertical Technology Probe Cards

WORLD-LEADING TECHNOLOGY

Wentworth's Cobra vertical contact, an industry standard for over twenty years, is based on the proven "buckling-beam" vertical contact concept, providing for high-speed probing of densely packed solder bump arrays found in advanced logic devices, microprocessors, ASICs and DSPs. Contact density (>5000 contacts), exceptional XY accuracy and planarity make Cobra probe cards ideal for today’s most demanding devices, including those utilizing advanced flip-chip packaging techniques.

APPLICATION-SPECIFIC DESIGN FLEXIBILITY

Cobra probe card products provide a variety of application-specific design options, including Multi-Layer Ceramic (MLC), Multi-Layer Organic (MLO) and wired space transformers, to satisfy users at both ends of the test spectrum.


Wentworth's proprietary process technology for transforming customers' Multi-Layer Organic (MLO) packages into space transformers provides a highly economical alternative to traditional Multi-Layer Ceramic (MLC) substrate technology, while substantially reducing manufacturing cycle time. A variety of Cobra contact materials, tip geometries and contact diameters are also available to further satisfy device-specific requirements. A proprietary design innovation involving the 3 mil Cobra contact allows for even denser array patterns, with more current carrying capability, while the 2.5 mil Cobra contact is unique to the industry, and the ultimate vertical contact for tight pitch applications. Finally, Cobra’s new "self cleaning," wedge tip geometry minimizes the need for routine cleaning while simultaneously improving contact resistance (CRes), due to a self-cleaning "wiping action" that continuously reduces residual build-up on the contact during the test cycle.

ROBUST, COST-EFFECTIVE PERFORMANCE

Cobra probe cards typically demonstrate exceptional performance of up to one million touchdowns. Individual contacts are field replaceable, for easy, on-site maintenance, while the entire Cobra probe head can be field interchanged to provide for optimum use of test equipment. This combination of durability, component modularity and maintenance flexibility make Cobra the most cost-effective, production-worthy, high-density probe card available today.

3 mil, wedge, BeCu
Cobra Contact
Dense Array MLC Dense Array MLO

All specifications are subject to change without notice.
Cobra® is a registered trademark of Wentworth Laboratories, Inc.
 
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Copyright 2006 Wentworth Laboratories, Inc.
01/06

PROBE CARDS