ADVANCED PROBE CARD SOLUTIONS
Specializing in fine pitch and multi-die applications, Wentworth Laboratories combines field-proven design rules with design innovation, to provide cantilever probe card solutions that meet the requirements of today’s most sophisticated devices, and equally sophisticated tester platforms. Layouts in access of 2000 probes are available, along with X16 multi-DUT designs.

QUALITY IN DESIGN & MANUFACTURE
Advanced auto-CAD/SolidWorks capabilities, fully automatic, networked electronic documentation and streamlined manufacturing techniques deliver product “in spec” and on time. A “zero-defect” quality program supports the entire cantilever process at manufacturing and support sites located in Connecticut, Texas and the U.K.

QUICK-TURN CAPABILITIES

Both generic and application-specific cantilever designs are available, capable of testing virtually every type of semiconductor device, including: logic, memory, ASICs, DSPs, GaAs and discrete devices. Generic PCB layouts are available for quick turn requirements, while Wentworth’s new "sunburst universal interface rings" easily and quickly satisfy both device applications and the PCB design challenges associated with the most current tester platforms. This design innovation also helps to standardize manufacturing for faster delivery of complex cantilever product. In stock availability of probe materials, including Tungsten, Tungsten Rhenium, Beryllium Copper and Paliney® 7, in sizes from 3-mil to 15-mil, and both metal and ceramic blades, helps to further satisfy fast turn-around requirements.

THIRTY YEARS OF INDUSTRY EXPERIENCE

Backed by 30 years of cantilever experience, along with advancements in both manufacturing techniques and materials, Wentworth’s cantilever products deliver robust performance and durability that adds to the overall cost effectiveness of cantilever probe card design.