The AWP 2000, semi-automatic prober, is a highly versatile, general-purpose tool that is easily adaptable for multiple applications such as failure analysis, WLR, QRA and characterization. Based upon Wentworth’s proven AWP probe station platform, the AWP 2000 delivers optimum probing performance for 2-inch to 8-inch full and partial wafers.

The AWP 2000’s compact design features a large area platen to accommodate open front probe cardholders and correspondingly large 4.5-inch and 6-inch wide probe cards. Production-proven Wentworth probing technology ensures continuous stepping accuracy.

Wentworth offers an extensive selection of vacuum and magnetic format manipulators for the AWP 2000. Precision AWP 2000 microscope movement is accomplished with a choice of manual or programmable microscope mounts and stereo or micro optic packages. For certain emission microscopy applications, the AWP 2000 microscope bridge is removable.

The AWP 2000 features an ergonomic remote keyboard for easy operational control. Complete integration with all tester configurations is assured using RS232/TTL or IEEE 488 interfaces.

Features

• 1-micron resolution
• Temperature chuck and laser compatible
• 10.5-inch open front PCH option
• Large platen surface area
• Manual or programmable microscope mounts
• Microscope quick lift and removable bridge
• Micro-zoom (Mitutoyo/A-Zoom) or stereo-zoom optics capability