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vertical probe card solutions for memory and logic · cantilever probe cards · complete custom probe card design · full complement of probers for applications to 300mm
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Accumax® Direct for Verigy V93000 Direct-Probe™
Wentworth Accumax®Direct integrated probe solution is qualified with the Verigy Direct-Probe™ option for the V93000 PinScale Test System.
Accumax®Direct addresses some of the most severe parameters encountered during volume test of flip chip bumped devices such as microprocessor units (MPUs), graphics processing units (GPUs) and System on Chip (SoC) devices. Wentworth's integrated docking design offers unmatched cost of ownership advantages derived from Wentworth's proprietary Saber®Probe contact technology, and contributes to enhanced data mining during high volume test that is integral to improving yield and profitability.
Accumax®Direct offers improved electrical connectivity between the device-under-test (DUT) and the test system, enabling more immediate data interpretation and corrective measures earlier in the sort process - helping to deliver improved output while reducing cost.
The proprietary design of Accumax®Direct utilizes a field replaceable and self-aligning multiple layer ceramic (MLC) or multiple layer organic (MLO) 'space transformer' to integrate an Accumax® vertical probe card with a performance interface board (PIB)/load board. The design utilized by Accumax®Direct can also accommodate Wentworth Megamax® vertical probe cards for extreme power test scenarios.
Accumax® Direct Integrated Direct Dock Solution
Accumax® Direct addresses some of the most severe test parameters encountered during high volume test of flip chip/C4 devices. These parameters include high density pin counts to 20,000 bumps/pillars, high current of 1 amp continuously for up to 2 minutes while probing at 130 µm or above, high frequency and single or multiple die applications.
The integrated direct dock design of Accumax® Direct reduces the interconnects that adversely affect consistent electrical contact between the tester and the device-under-test (DUT). This contributes to earlier resolution of issues affecting yield during the test process, promoting more cost-effective, high volume probe of high power flip chip devices such as microprocessor units (MPUs), graphics processing units (GPUs) and System on Chip (SoCs).
The design utilized by Accumax® Direct can also accommodate Wentworth Megamax® vertical probe cards for extreme power test scenarios.
The proprietary design of Accumax® Direct utilizes a field replaceable and self-aligning multiple layer ceramic (MLC) or multiple layer organic (MLO) 'space transformer' to integrate an Accumax® vertical probe card with a performance interface board (PIB)/load board. This direct dock design offers the performance, scalability, flexibility, and extended life cycle advantages of Wentworth's patented Accumax® construction, containing its Saber®Probe contact technology, to deliver unique cost of ownership advantages.
For example, the proprietary design of the Saber®Probe contact technology in Accumax® Direct has virtually eliminated the burning or 'fusing' of contacts that plague other vertical probe card technologies that cannot meet the combination of high current levels and high density.
A further advantage of Accumax® Direct is its site maintainability, by the user. Accumax® Direct empowers customers to remove and insert individual replacement contacts without disassembly, a significant productivity and cost advantage.