Wentworth Laboratories Micromax Vertical Probe Card

Wentworth Micromax is a vertical probe card for pre-bump flip chip or aluminum bond pad semiconductor devices, and is an effective alternative to cantilever type probe cards. Micromax is a high volume solution that allows for the test of multiple devices simultaneously as well as large arrays, without requiring planarization or alignment maintenance. Micromax delivers robust performance by utilizing Wentworth's proprietary Saber â Probe contact in a choice of two contact tip shapes, radius or spade (rounded edge), that easily break through oxides. Micromax Saber Probe contacts are photo-defined and chemically etched contacts that offer superb current carrying capability, superior life performance and scalability. Micromax' patented construction offers the unique advantage of on-site maintainability by the user.

Wentworth provides turnkey solutions from concept to completed probe card, with custom designed interfaces to facilitate communications between the device, probe card and tester.