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vertical probe card solutions for memory and logic · cantilever probe cards · complete custom probe card design · full complement of probers for applications to 300mm
Printed Circuit Boards
Interfaces
Wentworth Megamaxâ is a vertical probe card designed for ultra-high current and standard pitch Flip Chip / C4 bumped semiconductor devices.
The patented contact design of Wentworth Megamaxâ delivers a robust solution for the most demanding high volume production test, while offering favorable probe card cost of ownership.
Megamaxâ vertical probe cards utilize Wentworth's proprietary SaberâProbe contact, a photo-defined and chemically etched contact that offers superb current carrying capability, superior life performance and the scalability to simultaneously address the industry's most demanding pitch requirements.
Megamaxâ vertical probe cards offer the unique advantage of on-site maintainability by the user.
Wentworth provides turnkey solutions from concept to completed probe card, with custom designed interfaces to facilitate communications between the device, probe card and tester.
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Ultra-High Current Flip Chip / C4 Applications
On-Site Customer Maintainable Technology
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Megamax Vertical Probe Card
Megamax is capable of probing bumped devices with an excess of 20,000 bumps in a single or multiple die application. Interface options include: multiple layer organic, multiple layer ceramic, or wired space transformer, or to direct dock printed circuit boards.
Wentworth's patented Saber Probe contact technology enables our customers to perform their own maintenance and repair
Click photo to view a contact replacement
