©2012 Wentworth Laboratories, Inc. All rights reserved.  Headquarters: 500 Federal Road, Brookfield, CT  06804  USA   Tel: 203-775-9311, Fax:  203-775-6093

vertical probe card solutions for memory and logic · cantilever probe cards · complete custom probe card design · full complement of probers for applications to 300mm 

MenuMaker produced NavBar

In addition to exceptional probe card solutions, Wentworth Laboratories offers an expansive line of manual, semi-automatic and automatic wafer probing platforms and accessories for applications to 300mm. 

Wentworth's flagship platform is the Pegasus™ Series semi-automatic and automatic probers.  Pegasus Series probers utilize productivity-enhancing accessories such as an intuitive graphic user interface, submicron automated manipulators,  hot chucks, optics, laser, environmental chambers and more.  Wentworth probers are fully networked and are compatible with all major testers.

Pegasus Instrument Inc., a joint venture of Wentworth Laboratories and Quatek Group, manufactures Pegasus probers in Taiwan and provides field service and applications for China and Taiwan.  Wentworth is also an expert resource for the service and maintenance of Electroglas probers.

PCBS AND INTERFACES

PCBS AND INTERFACES

Prober Recommendations - Failure Analysis

FAST Links

More Analytical Probers

Semi-Automatic Probers

Pegasus 300S, 300mm
Semi-Automatic Prober

Traditional Testing, Device Characterization, Failure Analysis

Pegasus™ 300S is an economical, manual load, semi-automatic prober for probing wafers up to 300mm. It is excellent for general probing applications. Its modular design accommodates a wide range of productivity-enhancing options.

Pegasus S200FA, 200mm
Semi-Automatic Prober

Failure Analysis, WLR, QRA, Characterization

Pegasus™ S200FA, for 2-inch to 8-inch full and partial wafers, is an economical choice for failkure analysis applications and general purpose probing.

Pegasus300FA, 300mm
Semi-Automatic Prober

Failure Analysis, Reliability, Characterization

Pegasus™300FA, modeled on the 300S platform for probing 300mm wafers, is designed specifically for failure analysis applications, design verification and reliability probing of ultra-fine geometries.

Manual Probers

High Volume Probing of Power Devices

PML 8000, 200mm
Automatic Prober

PML 8000 for 8 inch/200mm wafers is ideal for failure analysis, device characterization and inline process verification, small geometry probing applications using high power optics, design debug and wafer level reliability.
300M manual analytical prober for 12 inch/300mm wafers delivers cost effective probing of wafers or packaged devices for semiconductor, research and education.  It is a robust and stable prober that is ideal for analytical applications.

Failure Analysis, Characterization, Design Verification

300M, 300mm
Manual Analytical Prober

Loading
aaaaaaaaaaaaiii