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Manual

PML 8000 analytical prober for 8 inch/200mm wafers is ideal for failure analysis, device characterization and inline process verification, small geometry probing applications using high power optics, design debug and wafer level reliability. 

Semi-Automatic

Pegasus S200 semi-automatic prober delivers rapid production probing of wafers up to 200mm, for semiconductors, MEMs, and characterization applications, and is ideal for probing LED die mounted onto blue tape/ring carriers.

Pegasus 300S semi-automatic prober for probing wafers up to 300mm using keypad control or an optional graphic user interface, delivers productivity-boosting performance for applications such as low volume probing, design verification, failure analysis, reliability, and for probing packaged components.

Pegasus S2000 semi-automatic prober for 2 inch/50mm to 8 inch/ 200mm full and partial wafers, is a general purpose tool for failure analysis, wafer level reliability, QRA and characterization.

Aspect L1 manual prober for 8 inch/200mm wafers is a versatile and economical solution for general diagnostic probing, engineering test and failure analysis.  It is designed for use with both 4.5 inch/ 114mm and 6 inch/150mm wide probe cards.

Headquarters:  Wentworth Laboratories, Inc., 500 Federal Road, Brookfield, CT  06804 USA  Tel: 203-775-9311, Fax: 203-775-6093

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