Manual
PML 8000 analytical prober for 8 inch/200mm wafers is ideal for failure analysis, device characterization and inline process verification, small geometry probing applications using high power optics, design debug and wafer level reliability.
Semi-Automatic
Aspect L1 manual prober for 8 inch/200mm wafers is a versatile and economical solution for general diagnostic probing, engineering test and failure analysis. It is designed for use with both 4.5 inch/ 114mm and 6 inch/150mm wide probe cards.
Pegasus 300FA, modeled on the 300S platform for probing 300mm wafers, is designed specifically for failure analysis applications, design verification and reliability probing of ultra-fine geometries.
Headquarters: Wentworth Laboratories, Inc., 500 Federal Road, Brookfield, CT 06804 USA Tel: 203-775-9311, Fax: 203-775-6093
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Wentworth Laboratories, Inc.
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