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vertical probe card solutions for memory and logic · cantilever probe cards · complete custom probe card design · full complement of probers for applications to 300mm
In addition to exceptional probe card solutions, Wentworth Laboratories offers an expansive line of manual, semi-automatic and automatic wafer probing platforms and accessories for applications to 300mm. Wentworth's flagship platform is the Pegasus™ Series semi-automatic and automatic probers. Pegasus Series probers utilize productivity-enhancing accessories such as an intuitive graphic user interface, submicron automated manipulators, hot chucks, optics, laser, environmental chambers and more. Wentworth probers are fully networked and are compatible with all major testers. Pegasus Instrument Inc., a joint venture of Wentworth Laboratories and Quatek Group, manufactures Pegasus probers in Taiwan and provides field service and applications for China and Taiwan. Wentworth is also an expert resource for the service and maintenance of Electroglas probers. PCBS AND INTERFACES PCBS AND INTERFACES Prober Recommendations - Design Verification FAST Links More Analytical Probers
Semi-Automatic Probers Manual Probers
PML 8000 for 8 inch/200mm wafers is ideal for failure analysis, device characterization and inline process verification, small geometry probing applications using high power optics, design debug and wafer level reliability
Aspect L1, 200mm General Diagnostic Probing, Failure Analysis, Engineering Test High Volume Probing of Power Devices
PML 8000, 200mm Failure Analysis, Characterization, Design Verification
300M, 300mm
Aspect L1 manual prober for 8 inch/200mm wafers is a versatile and economical solution for general diagnostic probing, engineering test and failure analysis. It is designed for use with both 4.5 inch/ 114mm and 6 inch/150mm wide probe cards.
300M manual analytical prober for 12 inch/300mm wafers delivers cost effective probing of wafers or packaged devices for semiconductor, research and education. It is a robust and stable prober that is ideal for analytical applications.
Pegasus S200FA, 200mm Failure Analysis, WLR, QRA, Characterization
Pegasus300FA, 300mm Failure Analysis, Reliability, Characterization
Pegasus™300FA, modeled on the 300S platform for probing 300mm wafers, is designed specifically for failure analysis applications, design verification and reliability probing of ultra-fine geometries.
Pegasus™ S200FA, for 2-inch to 8-inch full and partial wafers, is an economical choice for failkure analysis applications and general purpose probing.
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