Performance Advantages:

The Aspect L1 is a versatile and
economical solution for general
diagnostic probing, engineering test and
failure analysis of microcircuits on wafer
substrates up to 200mm (8”).
Aspect L1’s compact platform is
lightweight and easily upgradeable to two
additional configurations: high power
optics package (or low power
stereozoom microscopes); or fast probe
mode.

In addition, Aspect L1 is designed to
accept thermal chucks, and can
accommodate multiple Wentworth probe
manipulators and a probe card holder,
simultaneously.

With its easily maintainable design and
range of use, the Aspect L1 offers users
the advantage of an economical manual
probing platform with the ability to
significantly enhance its performance.

Performance Benefits:
 

Ease of use – ergonomically designed and
easily accessible features

Versatility – configurable for multiple probing
setups such as probe cards, PVX
manipulators (or a combination of both) and
low or high power microscopes
 

Ease of maintenance – open design makes all components easily accessible for virtually no required maintenance

Performance Features:

• Up to 200 mm (8”) wafer capability
• Rigid construction
• Precision manual XY stage and fine

   theta rotation
• Chuck plate vacuum lift
• Manual fine and coarse platform height
   adjustment
• Extensive range of accessories
• Options:
   - High power and low power optics
   - Probe card holder
   - Fast Probe mode