Accumax^® Vertical Technology for Flip Chip

Ultra-high current applications. Maintain your own vertical cards, on-site. ProbeAbility™.

Wentworth Laboratories’ Accumax is a vertical probe card for flip chip / bumped semiconductor devices commonly referred to as C4 devices.  Accumax utilizes Wentworth’s proprietary Saber™ contact, a photo-defined and chemically etched contact. The powerful design synergy of Saber contact technology in a new, revolutionary Accumax construction delivers very high performance with easy field maintainability. 

Superior Performance

Power requirements for complex, state-of-the-art flip chip devices are increasing at a staggering rate.  The Saber contact technology inherent in Accumax was engineered specifically for ultra-high current applications.  Saber carries one amp of current continuously and handles bursts over 2 amps while probing at 140-micron pitch or above.  This capability virtually eliminates the ‘burning’ or ‘fusing’ of contacts and thus significantly reduces the need for repair/service, while delivering increased reliability, stability and test cell utilization.  

Further, Saber is manufactured with much tighter mechanical tolerances than older technology Cobra^®-style contacts, producing more consistent planarity and scrub marks.

Accumax is capable of probing devices in excess of 10,000 bumps in a single or multi-die application.  Accumax can be interfaced to a multi-layer ceramic, multi-layer organic or a wired space transformer.

Field Reparability

Accumax allows for the replacement of individual contacts without major disassembly.  Its laminated construction eliminates what is commonly referred to as the ‘internal Mylar^®’ thus allowing easy access to individual Saber contacts.  This unique feature is exclusive to Wentworth Accumax, and it enables the customer to perform on-site repair and maintenance with confidence.

Probe devices in excess of 10,000 bumps              in a single or multi-die application

Wentworth Accumax enables on-site                   repair and maintenance –

Click here to view a contact                                replacement within a populated head