Wafer and Package Test Solutions

Related Links

ã 2008 Wentworth Laboratories, Inc.  All rights reserved.

Site feedback

LabMaster graphic user interface

Pegasus Probe Integrated Probe/Edge Sensor

·
·
Production Probing
APS80 automatic prober for 2 inch to 8 inch (50 mm to 200 mm) wafers, for high volume, special handling applications, such as GaAs, saw frames, ceramics and silicon
APS80 D automatic double-sided prober for 2 inch to 6 inch (50 mm to 150 mm) wafers, for high volume, double-sided wafer applications such as power device production
Pegasus S200
semi-automatic prober brings speed, versatility, accuracy and dependability to a variety of wafer and package testing applications.
Automatic

Semi-automatic

Pegasus S200 Diced Wafers/ LEDS/Discretes
semi-automatic prober is ideal for  probing diced wafers mounted onto blue tape/ring carriers, including LEDs.

LabMaster and Pegasus are trademarks of Wentworth Laboratories, Inc.

Site Map

Press Room

Careers

Contact Us

About Wentworth

Representatives

Sales Offices

Home

Advanced Cantilever Probe Card Solutions
Wafer and Package Test Solutions
Innovative Vertical Probe Card Technology
Request more information
Pegasus S200 D
semi-automatic double-sided prober delivers a robust  solution for double-sided probing of up to 8 inch/200mm applications involving discrete power semiconductors, MOSFETs, and IGBT devices.