Wentworth Laboratories offers a full complement of generic and automated test equipment (ATE) - specific design services.  Wentworth's expertise ranges from the development of low pin count, high frequency ceramic blade cards for GaAs devices, to high speed, dense, extreme power vertical probe cards for state-of-the-art logic applications.

Needle Holder Assemblies (NHAs)

PCB Design Capability / Tester Support
·  in-house design group
·  massive design databases
·  experienced in all major test systems / interfaces
Contact us for our extensive list of test systems supported

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For Vertical Logic, SOC, ASICs and DSPs, click here

Cantilever Products by Application

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PCB Design and Interface Solutions and NHAs

·   Up to 50 layers

·   Controlled impedences

·   Matched lengths within .005 in

·   Differential pair routing
·   Optimized by-passing schemes

·   ATE stiffener and mounting ring design   
    services and manufacturing

·   Frequency response up to 4.8 GHz
·   Gerber translation / generation
·   Schematic capture
·   Standard parts library
·   Comprehensive data package    
    including test file data

Custom PCB design

·   Full array of NHAs
·   Needle Metallurgy:  Tungsten, Tungsten / Rhenium, BeCU, Paliney, Gold Plating available
·   Blades:  Metal, Ceramic, Hybrid, Mini, Micro, Special configurations available
·   Fast turnaround

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Advanced Cantilever Probe Card Solutions
Wafer and Package Test Solutions
Innovative Vertical Probe Card Technology
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Wentworth's has developed an extensive library of master templates for all major tester platforms utilizing advanced design software for quick-turn printed circuit boards (PCBs).  Sophisticated mechanical design modeling software speeds the custom design of complex epoxy cantilever and vertical probe cards.
Wentworth's turnkey service includes custom designed vertical interfaces between the probe head and PCB (space transformers), including: hand wired, multiple layer ceramic (MLC), multiple layer organic (MLO), and direct dock.