PML8000 analytical prober for 8 inch/200mm wafers is ideal for failure analysis, device characterization and inline process verification, small geometry probing applications using high power optics, design debug and wafer level reliability (WLR). The PML 8000's unique vice chuck design allows quick and easy change-over between package devices and the wafer.
Aspect L1 manual prober for 8 inch/200mm wafers is a versatile and economical solution for general diagnostic probing, engineering test and failure analysis. It may be used with both 4.5 inch/114mm and 6 inch/150mm wide probe cards.
