Array Vertical Probe Card Product

Wentworth's Cobra vertical contact has been an industry standard for decades.  Based on the 'buckling-beam' concept, Cobra probe cards facilitate high-speed probing of densely packed solder bump arrays found in logic devices, microprocessors, ASICs and DSPs.

Cobra probe card products provide a variety of application-specific design options, including Multi-Layer Ceramic (MLC), Multi-Layer Organic (MLO) and wired space transformers.  A variety of Cobra contact materials, tip geometries and contact diameters are also available.

Advanced Cantilever Probe Card Solutions
Wafer and Package Test Solutions

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Accumax and Cobra are registered trademarks of Wentworth Laboratories, Inc.

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