Vertical Probe Card for Flip Chip Logic Devices

·   ultra-high current

Advanced Cantilever Probe Card Solutions
Wafer and Package Test Solutions
Innovative Vertical Probe Card Technology

Wentworth Accumax is a vertical probe card for flip chip / bumped semiconductor devices commonly referred to as C4 devices.  Accumax utilizes Wentworth's proprietary Saber ä contact, a photo-defined and chemically etched contact.  Saber is manufactured with much tighter mechanical tolerances than older technology Cobra â -style contacts, producing more consistent planarity and scrub marks.

Accumax allows for the replacement of individual contacts without major disassembly.  Its laminated construction eliminates what is commonly referred to as the 'internal Mylar', thus allowing easy access to individual Saber contacts.  This unique feature is exclusive to Wentworth Accumax, and it enables our customers to perform on-site repair and maintenance with confidence.

The powerful design synergy of Saber contact technology in our revolutionary Accumax construction delivers unprecedented performance, ultimately improving your cost of ownership.

Request a data sheet or more information about Accumax

·   tight pitch

·   single or multiple die

·   high contact counts

·   site maintainable by the customer
Wired
Space Transformers
MLC
MLO
·   easy off line cleaning
PCB Design Capability / Tester Support
·  in-house design group
·  massive design databases
·  experienced in all major test systems / interfaces
Contact us for our extensive list of test systems supported

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Available in Wedge or Flat Tip
- virtually eliminates the 'burning' or 'fusing' of contacts
View a contact replacement within a populated head

ã 2008 Wentworth Laboratories, Inc.  All rights reserved.

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Accumax is a registered trademark and Saber is a trademark of Wentworth Laboratories, Inc.

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