Cool Technology.  Short Time.  How to Probe It?

At Wentworth Laboratories, we have experienced this scenario with customers across a wide spectrum, from semiconductor test luminaries to its most innovative newcomers.  Projects are as diverse as the industries they represent: semiconductor, R&D, universities, automotive, aerospace, defense, medical, and many more.

Our expertise in probe card and wafer prober design, development and implementation helps our customers to meet critical test parameters - often within very challenging timelines.

Please consider Wentworth for your next challenge.  Our global team can support your probe card and wafer probing projects with custom design, proven technology, and experienced applications and technical support.

Wentworth Laboratories.  Custom Solutions from Concept to Completion.

Featured:  PCB Design
Interconnection Diagram

Design Service

Featured:  Pegasus™ S200FA
Semi-Automatic  Prober

Pegasus™ S200FA

Probers and Accessories

FAST Links

Verimax, Accumax, Accumax Direct, Megamax, Pegasus Series Probers, Accessories, Cantilever Probe Cards, Cantilever Build/Repair Stations, Interfaces,PCBs, NHAs, Sales Offices, Representatives, Support for Electroglas probers

At a Glance

At a Glance

Verimax™
 Vertical probe card for Flip Chip/C4 offering cost-reducing
attributes, longevity and quality design to boost productivity and help to achieve higher tester utilization

Pegasus™ S200FA and Pegasus™ S300FA
 Remarkably versatile, easy to use probers recommended for failure analysis, device characterization, radio frequency/
microwave, die probing, low volume wafer probing, and/or
ultra-fine geometries at the die level 

Accumax® Direct
 Integrated vertical probe card direct dock solution 
for probing high frequency Flip Chip/C4 

Accumax® Direct for Verigy 93000 Direct Probe™ 
Integrated probe solution in partnership with Verigy

Wentworth Services Electroglas Probers in Europe
2000 Series, 3001X, 4080 - 4085, and 4090-4090 m+
probers

Wentworth Joint Venture in China
Pegasus Instrument manufactures Wentworth Pegasus™ probers and provides field service and applications engineering for China and Taiwan.

At a Glance

©2014 Wentworth Laboratories, Inc. All rights reserved.  Headquarters: 500 Federal Road, Brookfield, CT  06804  USA   Tel: 203-775-9311, Fax:  203-775-4398

Probe Cards:  Vertical, Cantilever

vertical probe card solutions for memory and logic · cantilever probe cards · complete custom probe card design · full complement of probers for applications to 300mm 

Cool Technology.  Short Time.  How to Probe It?

At Wentworth Laboratories, we have experienced this scenario with customers across a wide spectrum, from semiconductor test luminaries to its most innovative newcomers.  Projects are as diverse as the industries they represent: semiconductor, R&D, universities, automotive, aerospace, defense, medical, and many more.

Our expertise in probe card and wafer prober design, development and implementation helps our customers to meet critical test parameters - often within very challenging timelines.

Please consider Wentworth for your next challenge.  Our global team can support your probe card and wafer probing projects with custom design, proven technology, and experienced applications and technical support.

Wentworth Laboratories.  Custom Solutions from Concept to Completion.

Featured:  PCB Design
Interconnection Diagram

Featured:  Pegasus™ S200FA
Semi-Automatic  Prober

Featured:
Verimax™ Direct

Probe Cards:  Vertical, Cantilever

FAST Links

At a Glance

Wentworth Joint Venture in China
Pegasus Instrument manufactures Wentworth Pegasus™ probers and provides field service and applications engineering for China and Taiwan.

Wentworth Services Electroglas Probers in Europe
2000 Series, 3001X, 4080 - 4085, and 4090-4090 m+
probers

Accumax® Direct for Verigy 93000 Direct Probe™ 
Integrated probe solution in partnership with Verigy

Accumax® Direct
 Integrated vertical probe card direct dock solution 
for probing high frequency Flip Chip/C4 

Pegasus™ S200FA and Pegasus™ S300FA
 Remarkably versatile, easy to use probers recommended for failure analysis, device characterization, radio frequency/
microwave, die probing, low volume wafer probing, and/or
ultra-fine geometries at the die level 

Verimax™ 
Vertical probe card for Flip Chip/C4 offering cost-reducing
attributes, longevity and quality design to boost productivity and help to achieve higher tester utilization

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